High frequency analysis of a device under test

ABSTRACT

Analyzing a device under test (“DUT”) at higher frequencies. A phase shifter varies the phase of a standing wave on a transmission line coupled to the DUT. The standing wave magnitude is sampled at each of the phase shifts and one or more DUT characteristics are determined as a function of the sampled magnitudes and phase shifts. Further aspects include a related phase shifter comprising a waveguide having a plurality of sub-resonant slots formed therein and having active elements for loading the slots to control the phase shift applied to the signal.

STATEMENT OF GOVERNMENT INTEREST

The U.S. Government has a paid-up license in this invention and theright in limited circumstances to require the patent owner to licenseothers on reasonable terms as provided for by the terms of contract No.FA8103-07-C-0193 awarded by the U.S. Air Force.

BACKGROUND

Measurement of transmitted and reflected millimeter wave and microwavesignals is useful for characterizing the properties of a device undertest. Such properties, typically measured by a vector network analyzer,include the complex (i.e., magnitude and phase) reflection andtransmission coefficients. Devices under test are, for example, highfrequency circuit components, equipment that performs materialcharacterization or nondestructive testing and evaluation, imagingsystems, high-frequency transceivers, and ranging systems. Currently,taking measurements of transmitted and/or reflected signals at highfrequencies involves expensive vector network analyzers, which employphased-locked input sources and heterodyne detection processes toisolate or determine the frequencies to be measured. In addition tobeing prohibitively expensive, current vector network analyzers areconsidered bulky for applications where handheld, customized, and/orspecial purpose measurement modules are needed.

Accurate vector measurement of high frequency signals (i.e., theirmagnitude and phase) reflected back from and transmitted through adevice under test (“DUT”) helps characterize the electrical performanceof the DUT. By way of analogy, FIG. 1 demonstrates these signals as awave directed towards a slab 100, wherein the slab reflects and/ortransmits an incident wave 102. FIG. 1 diagrammatically illustrates theincident wave 102 striking the slab, a reflected wave 104, and atransmitted wave 106. Based on measurements of the reflected and/ortransmitted waves, the DUT can be characterized using known methods todetermine its properties, such as its electrical impedance or the amountof signal distortion it causes to the supplied signal.

Among measurement devices known in the prior art for the measurement ofthe phase and magnitude of high frequency signals, FIGS. 2A-2Dillustrate their operation. As shown in FIG. 2A, a vector networkanalyzer (VNA), generally indicated as 198, operably connects a stimulussource 214 (e.g., a built-in phased-locked oscillator) to a DUT 202. Thesource 214 supplies an incident signal 204 to the DUT 202. In aconventional test set-up, a plurality of directional coupling devices210 separate the incident signal 204 from a reflected signal 206 and atransmitted signal 208. In turn, a receiver/detector 200 collects thesignals 204, 206, 208 via the multiple directional coupling devices 210.In a typical vector network analyzer, such as VNA 198, thedetector/receiver 200 comprises a tuned receiver, such as a superheterodyne receiver, allowing a high frequency input signal to betranslated to a lower frequency through a process known in the art asdown-conversion. The VNA 198 uses a reference signal (e.g., the incidentsignal 204 or a signal supplied from a second high-frequency sourcephase-locked to the primary stimulus source 214) in the down-convertingprocess to mix with other signals. To down-mix the signals 204, 206 inthis manner, VNA 198 must maintain signal separation and prevent thesignals from interacting to form a combined or standing wave.

Other exemplary prior art techniques for measuring the phase andmagnitude of high frequency signals are illustrated in FIGS. 2B-2D. Asshown, these additional methods do not utilize heterodyne/tunedreceivers. FIG. 2B illustrates a slotted-line method of measuring acomplex reflection coefficient of a standing wave. This method utilizesa single detector probe 220 to gather measurements on a transmissionline 222. However, the probe 220 must be physically moved along thelength of the transmission line 222 to obtain the multiple measurementsneeded to accurately measure the complex reflection coefficient. Sincethe distance 224 between the DUT (not shown) and the detector 220 is afactor in the complex coefficient calculation, each change in positionmust be accurately measured and recorded contemporaneously with thecorresponding transmission line measurement. This repeated repositioningand distance measuring makes automation burdensome, adding to the costand complexity of implementing the slotted line method shown in FIG. 2B.

Referring now to FIG. 2C, a sampled line method requires at least threefixed detector probes 240 along a length of transmission line 242 toobtain the desired measurements unambiguously. Although this prior artmethod avoids the repositioning of a single detector probe (see FIG.2B), probe interaction and non-identical probes introduce measurementerrors that significantly affect measurement accuracy.

Another method known in the art for measuring incident and reflectedsignals is the so-called perturbation two-port (“PTP”) methodillustrated in FIG. 2D. The PTP method is based on using a combinationof two-port perturbation (PTP) networks 260 inserted before the DUT 262and a scalar network analyzer 264 (i.e., high quality reflectometerrealized with a directional coupler). Multiple PTP networks 266, eachrepresenting different electrical characteristics, are required. EachPTP network changes/transforms the sought DUT reflection coefficientappearing at the input of the scalar network analyzer 264. When thesemultiple PTP networks are used along with a multi-step calibrationroutine, the sought after reflection coefficient can be determined (bothmagnitude and phase) after measuring the magnitude of the reflectioncoefficient seen at the input of the scalar network analyzer. Like theprior art VNA described above with respect to FIG. 2A, the PTP methoddemands signal separation. In the PTP method embodied in FIG. 2D,directional couplers (within the implementation of the scalar networkanalyzer) are again required to maintain separation between the incidentand reflected signals. Furthermore, the PTP method requires that some ofthe used PTP networks have losses associated with them. Without signalseparation and lossy PTP networks, the PTP method fails to work.

The conventional VNA 198 in FIG. 2A maintains signal separation of theincident, reflected, and transmitted signals, and employs one or morespecialized tuned, heterodyne receivers to selectively isolate andanalyze the signals collected, all of which increase the size, cost, andcomplexity of the device. Other prior art devices described aboveperform measurements without heterodyne procedures, but due tolimitations inherent in their designs, measurement inaccuraciessignificantly undermine the useful operation of these devices. As notedabove, it remained for the present inventors to discover a method andsystem of measuring the transmitted and reflected signals of a deviceunder test without the cost and complexity of a tuned receiver,requiring directional coupling devices, or the introduction ofsignificant inaccuracies in the measurement process.

SUMMARY

According to aspects of the invention, generating and manipulating thephase of a standing wave on a transmission line coupled to a deviceunder test permits measuring the characteristics, e.g., phase andmagnitude, of the transmitted and reflected wave signal associated withthe device.

Briefly, a method for analyzing a device under test embodying aspects ofthe invention includes generating a standing wave on a transmission linecoupled to the device under test, varying the phase of the standing wavewith a phase shifter, and sampling the magnitude of the standing wave ateach of a plurality of phase shifts. The method further includesdetermining at least one characteristic representative of the deviceunder test as a function of the sampled magnitude of the standing waveand the plurality of phase shifts.

Another aspect of the invention is directed to a system for analyzing adevice under test. The system includes a transmission line for couplinga signal source to the device under test. The signal source in turnprovides a signal incident to the device under test. The signal incidentto the device under test and a signal reflected from the device undertest form a standing wave on the transmission line. The system alsoincludes a phase shifter for varying the phase of the standing wave anda detector probe coupled to the transmission line for sampling amagnitude of the standing wave at each of a plurality of phase shiftvalues. At least one characteristic representative of the device undertest is determined as a function of the sampled magnitude of thestanding wave on the transmission line and the plurality of phase shiftvalues.

In another aspect, a vector network analyzer for determining phase andmagnitude of signals at a frequency greater than very high frequencyincludes a phase shifter receiving and responsive to a phase controlsignal for applying a phase shift to a standing wave on a transmissionline. The transmission line is coupled to a port of a device under testand a transmission line probe coupled to the transmission line samples amagnitude of the standing wave on the transmission line at each of aplurality of phase shift values. The probe is configured to generate adetector signal that corresponds to the sampled magnitude of thestanding wave and a processor, receiving and responsive to the detectorsignal from the transmission line probe, determines at least onecharacteristic representative of the devices as a function of thesampled magnitude of the standing wave on the transmission line. Inaddition, the processor is configured for generating the phase shiftercontrol signal.

A phase shifter coupled with a transmission line for applying a phaseshift to a signal on the transmission line embodies further aspects ofthe invention. The phase shifter includes a waveguide having a pluralityof slots formed therein. The slots each have dimensions that aresub-resonant with respect to a wavelength of the signal, which is at afrequency greater than very high frequency, and have an active elementcorresponding thereto for loading the slots to control the phase shiftapplied to the signal.

In accordance with aspects of the present invention, proper use of acombination of a transmission line, a detector, and a phase shiftereliminates the need for expensive heterodyne/tuned receiver detectionschemes.

Other features will be in part apparent and in part pointed outhereinafter.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates the transmission and reflection of high-frequencysignals.

FIGS. 2A-2D are diagrams of prior art network analyzers, with multipleport connections to measure the incident, reflected, and transmittedhigh frequency signals.

FIG. 3 illustrates a vector network analyzer according to an embodimentof the present invention.

FIG. 4 illustrates a controlled phase shifter according to an embodimentof the present invention.

FIG. 5 and FIG. 6 illustrate exemplary measurements collected inaccordance with an embodiment of the present invention as compared tomeasurements collected by a prior art vector network analyzer.

Corresponding reference characters indicate corresponding partsthroughout the drawings.

DETAILED DESCRIPTION

Referring now to FIG. 3, a vector network analyzer (VNA) 298 embodyingaspects of the present invention is shown in block diagram form.Advantageously, the VNA 298 is capable of obtaining measurements ofsignals at frequencies greater than very high frequency, includingmicrowave and millimeter frequency signals, for analyzing performancecharacteristics of a device under test (DUT) 318. The DUT 318 can be,for example, a radar antenna, etc.

In one embodiment, VNA 298 comprises a transmission line 300 coupled toan input port 299 of the DUT 318. In this embodiment, the transmissionline 300 is configured to transmit signals along its length to and fromDUT 318, as shown in FIG. 3. The transmission line 300 can be, but isnot limited to, a waveguide, coaxial line, or a micro-strip line. Whenan appropriate source signal 310 is supplied to transmission line 300, aresulting standing wave is formed along the length of the transmissionline 300 as a function of the superposition of an incident signal 312and a reflected signal 314 from the input port 299 of the DUT 318propagating in opposite directions.

Referring further to the embodiment of FIG. 3, the VNA 298 comprises atransmission line 300 coupled with a controlled phase shifter 304, anembodiment of which is described below. The exemplary embodimentdemonstrated in FIG. 3 shows a wave source 302 capable of generatingsignals greater than very high frequency. The source 302 is coupled tothe transmission line 300 (see node 310 of FIG. 3). In the illustratedembodiment, this combination of elements allows for the generation ofstanding waves along a length of transmission line 300, due to thecoherent addition of the signal applied to the input of the transmissionline from the signal source 302 and the signal reflected from the port299 of the DUT 318. According to aspects of the present invention, thecontrolled phase shifter 304 permits changes to the phasecharacteristics of the resulting standing wave.

An embodiment of the phase shifter 304 of the present invention is shownin FIG. 4. In this embodiment, phase shifter 304 utilizes a plurality ofsub-resonant slots 402 formed in a printed circuit board (“PCB”) 406used as a wall of a rectangular waveguide 400. According to aspects ofthe invention, loading the slots 402 with active elements 404 allowsphase shifts to be applied to the standing wave generated along thelength of transmission line 300. The slots 402 are configured to have alength (L_(s)) 416 and width (W_(s)) 418, such that the slots 402 aresub-resonant with respect to the wavelength of the signals beingmeasured. In other words, the slots do not radiate efficiently.Additionally, the slots are configured to have a same-row slotscenter-to-center separation (S) 410 and a slot-to-waveguide edgeseparation (s) 412 over the total waveguide length (L) 408 and width (a)(see element 414).

In FIG. 4, the slots 402 are cut out into a printed circuit board (PCB)406 forming the broad wall of the rectangular waveguide 400. In analternative embodiment, the slots 402 are on the narrow wall. The slots402 are formed in a longitudinal or transverse direction in the wall ofthe waveguide 400. FIG. 4 demonstrates slots 402 configured in atransverse direction. It is contemplated that the slots 402 can beplaced or configured in any such manner that provides sufficientinteraction with the current following on the walls of the waveguide400. For example, if slots 402 are placed on or near the centerline 420and rotated ninety degrees from the slot orientation demonstrated inFIG. 4, the slots 402 would be orthogonal to the current flow in thewaveguide 400. The slots 402 can be formed in a variety ofconfigurations to achieve sufficient phase shifts. However, slots 402should be placed in a manner that minimally disturbs the standing waveshape and optimally affects the current flow on the wall of thewaveguide 400. Additionally, slots 402 should have sub-resonantdimensions L_(s) 416 and W_(s) 418 such that the slots 402 do not causesignal reflection in and/or radiation from the waveguide 400. In theillustrated embodiment, the slots 402 are loaded with active elementssuch as PIN diodes 404, thereby allowing for electronic control of theapplied phase shift.

In the example of FIG. 4, nine PIN diode loaded slots 402 aredemonstrated, and turning each PIN diode 404 on and off using controldirect current (dc) bias allows for 10 distinctive phase shifts to beapplied to the signal on the transmission line 300. The phase shifter ofFIG. 4 is provided by way of example and not limitation, and it shouldbe understood that other slot configurations and active elements existand are within the scope of the present invention.

The phase shifter can be calibrated using, for example, a high accuracyvector network analyzer to directly measure the scattering parameters ofthe phase shifter for use in the mathematical model described below.Otherwise, the phase shifter may be calibrated using a total of sixknown loads connected at the test port 299. Using the measurements ofthese six loads, the scattering parameters of the phase shifter can bedetermined by solving a set of six nonlinear equations.

Referring again to the embodiment illustrated in FIG. 3, at least onetransmission line probe 306 is coupled to the transmission line 300 tosample the standing wave created on the transmission line 300 at aplurality of different phase shifts. The probe 306 is further configuredto generate a detector signal 320 that corresponds to the sampledmagnitude of the standing wave signal. In one embodiment, the probe 306is an active element, such as a diode. A diode will produce a dc signalthat is proportional to the magnitude of the sampled standing wave.Advantageously, varying the phase shift applied to the standing wavepermits a plurality of samples to be taken without altering theplacement of the probe or requiring multiple probes, as required in theprior art devices. Advantageously, eliminating the need to move theprobe relative to the standing wave and eliminating the need formultiple probes prevents the resulting errors from being introduced intothe sampled measurements. As a result, the generated informationrepresentative of a device under test is more accurate while minimizingVNA cost and complexity. In an alternative embodiment, a plurality ofprobes 306 are coupled to the transmission line 300 to sample thestanding wave created on the transmission line 300 at a plurality ofdifferent phase shifts, allowing for greater sampling accuracy over awideband of frequencies.

FIG. 3 also illustrates a processor 308 configured to receive andrespond to the detector signal 320. In response to the detector signal320, processor 308 generates a source control signal 324, which itcommunicates to signal source 302 for controlling the incident signalinjected into the transmission line 300 at 310. In addition, processor308 also generates a phase shifter control signal 326 for controllingthe amount of phase shift applied to the generated standing wave on thetransmission line 300 by phase shifter 304. For instance, the phaseshift control signal 326 turns on and off PIN diodes 404 for loading andunloading slots 402. The processor 308 optionally generates switchcontrol signal 334 to turn the switch on and off. The processor 308 isalso configured to generate information representative of the standingwave and the DUT 318 as a function of the sampled magnitude of thestanding wave on transmission line 300 and the applied phase shift ateach sampling.

In another embodiment, the processor 308 outputs the representativeinformation to a display device or other suitable output device such as,but not limited to, memory storage, hard drive storage, or a printingdevice. In other embodiments of the present invention, the signal source302 and/or phase shifter 304 are configured to communicate informationto the processor 308 as well.

Referring further to FIG. 3, the processor 308 provides control signal326 to the phase shifter 304 for setting the phase shift, providescontrol signal 324 for setting the operating parameters of the signalsource 302 (e.g., frequency and magnitude level), provides switchcontrol signal 334 to turn the switch on and off, and processes theresultant detector signal 320 at each applied phase shift. In oneembodiment, the processor 308, operating in response to stored computerinstructions, automatically shifts the phase and/or sweeps throughfrequencies and determines the representative information in real-time.In other embodiments of the present invention, the processor operates inresponse to manual operator control such as, but not limited to, keypador keyboard entry, dial settings, or switches.

In an alternative embodiment, VNA 298 also includes a switcheddirectional isolating element 332 coupled to a second port 330 of theDUT 318. In this embodiment, the switched directional isolating element332 comprises a switch and an isolator as shown in FIG. 3. When anappropriate source signal 310 is supplied to the transmission line 300,a resulting standing wave is formed along the length of the transmissionline 300 as a function of the superposition of incident signal 312 andreflected signal 314 from the input port 299 as well as a through testsignal 338 passing through the DUT 318 via port 330 to port 299. Asbefore, incident signal 312 and reflected signal 314 propagate inopposite directions. Likewise, incident signal 312 and through testsignal 338 propagate in opposite directions. When the directionalisolating element 332 is turned off in response to a switch control 334,a one-port (i.e., reflection) measurement can be conducted. On the otherhand, when directional isolating element 332 is turned on, a two-port(transmission and reflection) measurement can be conducted. Thiscombination of elements allows for the generation of standing wavesalong a length of transmission line 300, due to the coherent addition ofthe signal 310 applied to the input of the transmission line from thesignal source 302 and the signal reflected 314 from the port 299 of theDUT 318, as well as the signal transmitted through the DUT 338 when thedirectional isolating element 332 is turned on. When the isolatingelement is turned on, the transmitted signal 316 is observed by theisolator 340. As with the signal source 302 and the phase shifter 304,directional isolating element 332 may also be configured to communicateinformation to the processor 308.

FIGS. 5 and 6 demonstrate exemplary results of an embodiment of thepresent invention as compared to the results of a prior art VNA (e.g.,VNA 198).

The following mathematical models can be used to characterize the DUT318 as a function of the applied phase shift and detector samples viaprobe 306 when the VNA 298 is configured to measure the reflected signalonly (i.e. switch 332 is turned off):

V_(d)(φ_(m)) = C1 + Γ^(−2j β L)², m = 1, 2, …  M$\Gamma = {S_{11,p} + \frac{S_{21,p}S_{12,p}S_{11}}{1 - {S_{22,p}S_{11}}}}$

S_(ij,p), i=1, 2, j=1,2: Phase shifter scattering parameters as afunction of the phase shift Φ (as determined either through direct,independent VNA measurements, or solving six nonlinear equations usingthe measurement of six known loads).

V_(d)(Φ_(m)): voltage sampled at detector

C: detector response

β: propagation factor

L: distance between detector and phase shifter on transmission line

S₁₁: input port voltage reflection coefficient (of the DUT)

M: total number of phase shift settings.

The M system of nonlinear equations can be solved (e.g., using theNewton-Gauss method) to find S₁₁. S-parameters are used by the presentinvention, as it is typically difficult to measure total current orvoltage at higher frequencies.

Several experiments were conducted on an automated prototype VNA systemusing embodiments of the current invention to confirm its operation. Thedeveloped prototype VNA performance was verified against thecommercially available HP8510C vector network analyzer (VNA). Referringto the experimental results illustrated in FIGS. 5 and 6, the prototypeVNA (using a voltage controlled phase shifter) and the HP8510C were bothused to measure the reflection coefficient of various DUTs at 10 GHz.The utilized DUTs represented a wide range of devices of variousreflection properties. The magnitude of the reflection coefficient ofthe utilized DUT ranged from −2 dB to −30 dB and its phase ranged from 0to 360 degrees. A DUT with these ranges advantageously spans the entirerange of possible reflection measurements (as represented by the circleof unity radius in FIG. 5).

The prototype VNA was configured with an electronic phase shiftercapable (of a type different from the embodiment illustrated in FIG. 4)of provided three phase shifts settings (M=3) in response to dc controlvoltage. The phase shifter was independently calibrated. FIG. 5 comparesthe experimental vector reflection measurements (in polar form) obtainedusing the prototype VNA and the HP8510C VNA for the same DUT. Asdemonstrated in the exemplary results in FIG. 5, both devices producedcomparable results. FIG. 6 demonstrates the experimentally-measuredmagnitude of the reflection coefficient for the variable DUT using boththe prototype VNA and the commercially available HP8510C VNA. It isimportant to observe the linearity of the response of the prototype VNA,embodying certain aspects of the present invention, and how well theseexperimental results compare to the much more expensive HP8510C VNA.

As shown FIGS. 5 and 6, the prototype VNA exemplary experimentalmeasurements closely match those of the HP8510C VNA. These exemplaryexperimental results confirm the operation of the developed VNA andapproach for vector reflection coefficient measurement with accuracycomparable to the commercial, expensive, and complex HP8510C VNA. Italso highlights the desired linearity of the detection scheme.

In another preferred embodiment, the controlled phase shifter 304 is acommercially available phase shifter capable of providing discrete phaseshifts to signals on a transmission line 300. The commercially availablephase shifter must be capable of providing accurate, discrete phaseshifts for the wave region to be measured while weakly perturbing thesignals.

In yet another preferred embodiment, the controlled phase shifter 304 isa phase shifter embodying aspects of FIG. 4, where such a phase shifterpermits measurements at higher frequencies.

In another preferred embodiment, the signal 310 can be externallysupplied, with the signal source configured to receive control signalsfrom the processor for controlling the characteristics of the suppliedsignal. In another embodiment, the signal source is configured forindependent source control.

In operation, a method embodying aspects of the invention includesgenerating a standing wave on a transmission line 300 coupled to thedevice under test 318, varying the phase of the standing wave with aphase shifter 304, and sampling the magnitude of the standing wave ateach of a plurality of phase shifts. Further, the method determines atleast one characteristic representative of the device under test 318 asa function of the sampled magnitude of the standing wave and theplurality of phase shifts. Such characteristics include, but are notlimited to, phase and magnitude of the reflected signal 314 or thetransmitted signal 316, dielectric properties of the DUT 318, calculatedas a function of the phase and magnitude of the reflected signal 314,and structural properties of the DUT 318.

In operation, a system embodying aspects of the invention analyzes adevice under test 318. The system includes a transmission line 300 forcoupling a signal source 302 to the device under test 318, wherein thesignal source 302 provides a signal 310 incident to the device undertest and wherein the signal 312 incident to the device under test 318and a signal 314 reflected from the device under test 318 form astanding wave on the transmission line 300. The system is furthercomprised of a phase shifter 304 for varying the phase of the standingwave and a detector probe 306 coupled to the transmission line 300 forsampling a magnitude of the standing wave at each of a plurality ofphase shift values. Thus, at least one characteristic representative ofdevice under test 318 is determined as a function of the sampledmagnitude of the standing wave on the transmission line 300 and theplurality of phase shift values.

In operation, a vector network analyzer 298 embodying aspects of theinvention determines the phase and magnitude of signals at a frequencygreater than very high frequency for a device under test 318. The vectornetwork analyzer 298 includes a phase shifter 304 receiving andresponsive to a phase control signal 326 for applying a phase shift to astanding wave on a transmission line 300, said transmission line 300being coupled to a port 299 of the DUT 318, and a transmission lineprobe 306 coupled to the transmission line 300 for sampling a magnitudeof the standing wave on the transmission line 300 at each of a pluralityof phase shift values, said probe 306 being configured to generate adetector signal 320 that corresponds to the sampled magnitude of thestanding wave. In this instance, the vector network analyzer 298 furthercomprises a processor 308 receiving and responsive to the detectorsignal 320 from the transmission line probe 306 for determining at leastone characteristic representative of the DUT 318 as a function of thesampled magnitude of the standing wave on the transmission line 300,said processor being further configured for generating the phase shiftercontrol signal.

In another embodiment, the present invention is a phase shifter coupledwith a transmission line for applying a phase shift to a signal on thetransmission line, said signal being at a frequency greater than veryhigh frequency, said phase shifter comprising a waveguide having aplurality of slots formed therein, said slots each having dimensionsthat are sub-resonant with respect to a wavelength of the signal on thetransmission line, and said slots each having an active elementcorresponding thereto for loading the slots to control the phase shiftapplied to the signal.

While specific embodiments are discussed, it should be understood thatthis is done for illustrative purposes only. A person skilled in therelevant art will recognize that other components and configurations canbe used without parting from the spirit and scope of the invention.

The order of execution or performance of the operations in embodimentsof the invention illustrated and described herein is not essential,unless otherwise specified. That is, the operations may be performed inany order, unless otherwise specified, and embodiments of the inventionmay include additional or fewer operations than those disclosed herein.For example, it is contemplated that executing or performing aparticular operation before, contemporaneously with, or after anotheroperation is within the scope of aspects of the invention. Embodimentsof the invention may be implemented with computer-executableinstructions. The computer-executable instructions may be organized intoone or more computer-executable components or modules. Aspects of theinvention may be implemented with any number and organization of suchcomponents or modules. For example, aspects of the invention are notlimited to the specific computer-executable instructions or the specificcomponents or modules illustrated in the figures and described herein.Other embodiments of the invention may include differentcomputer-executable instructions or components having more or lessfunctionality than illustrated and described herein.

When introducing elements of aspects of the invention or the embodimentsthereof, the articles “a,” “an,” “the,” and “said” are intended to meanthat there are one or more of the elements. The terms “comprising,”“including,” and “having” are intended to be inclusive and mean thatthere may be additional elements other than the listed elements.

Having described aspects of the invention in detail, it will be apparentthat modifications and variations are possible without departing fromthe scope of aspects of the invention as defined in the appended claims.As various changes could be made in the above constructions, products,and methods without departing from the scope of aspects of theinvention, it is intended that all matter contained in the abovedescription and shown in the accompanying drawings shall be interpretedas illustrative and not in a limiting sense.

1. A method of analyzing a device under test comprising: generating astanding wave on a transmission line coupled to the device under test;varying the phase of the standing wave with a phase shifter; samplingthe magnitude of the standing wave at each of a plurality of phaseshifts; and determining at least one characteristic representative ofthe device under test as a function of the sampled magnitude of thestanding wave and the plurality of phase shifts.
 2. The method of claim1, wherein a greater than very high frequency signal source supplies thesignal.
 3. The method of claim 1, wherein the standing wave comprises asignal incident to the device under test and a signal reflected from thedevice under test.
 4. The method of claim 1, wherein the standing wavefurther comprises a signal transmitted through the device under test. 5.The method of claim 1, wherein sampling the magnitude of the standingwave comprises measuring a voltage of the standing wave at each of theplurality of phase shifts and wherein determining at least onecharacteristic representative of the device under test comprisesmeasuring a reflection coefficient of the device under test as afunction of the measured voltage at each of the plurality of phaseshifts.
 6. The method of claim 1, wherein the phase shifter is coupledto the transmission line and comprises one or more sub-resonant slots,said slots each having an active element positioned therein, and whereinvarying the phase comprises controlling the active element to load theslot in which the active element is positioned for altering the phase ofsignals on the transmission line.
 7. The method of claim 6, wherein theslots have sub-resonant dimensions formed in the wall of a waveguide. 8.A system for analyzing a device under test, the system comprising: atransmission line for coupling a signal source to the device under test,wherein the signal source provides a signal incident to the device undertest and wherein the signal incident to the device under test and asignal reflected from the device under test form a standing wave on thetransmission line; a phase shifter for varying the phase of the standingwave; and a detector probe coupled to the transmission line for samplinga magnitude of the standing wave at each of a plurality of phase shiftvalues, wherein at least one characteristic representative of the deviceunder test is determined as a function of the sampled magnitude of thestanding wave on the transmission line and the plurality of phase shiftvalues.
 9. A system of claim 8, wherein the signal source generates thesignal incident to the device under test at a frequency greater thanvery high frequency.
 10. A system of claim 8, wherein the standing wavecomprises the signal incident to the device under test, the signalreflected from the device under test, and a signal transmitted throughthe device under test.
 11. A system of claim 8, further comprising aprocessor configured for determining the at least one characteristicrepresentative of the device under test.
 12. A system of claim 11,wherein the detector probe measures a voltage of the standing wave ateach of the plurality of phase shift values and wherein the at least onecharacteristic determined by the processor comprises a reflectioncoefficient of the device under test as a function of the measuredvoltage at each of a plurality of phase shift values.
 13. A system ofclaim 8, wherein the phase shifter is coupled to the transmission lineand comprises one or more sub-resonant slots, said slots each having anactive element positioned therein, and wherein the phase shiftercontrols the active element to load the slot in which the active elementis positioned for varying the phase of the standing wave.
 14. A systemof claim 13, wherein the phase shifter comprises a waveguide having theslots formed therein.
 15. The system of claim 8, wherein the signalsource provides the signal incident to the device under test at afrequency greater than very high frequency.
 16. The system of claim 8,further comprising another detector probe coupled to the transmissionline for sampling a magnitude of the standing wave at each of aplurality of phase shifts.
 17. A vector network analyzer for determiningphase and magnitude of signals at a frequency greater than very highfrequency for a device under test (DUT), said vector network analyzercomprising: a phase shifter receiving and responsive to a phase controlsignal for applying a phase shift to a standing wave on a transmissionline, said transmission line being coupled to a port of the DUT; atransmission line probe coupled to the transmission line for sampling amagnitude of the standing wave on the transmission line at each of aplurality of phase shift values, said probe being configured to generatea detector signal that corresponds to the sampled magnitude of thestanding wave; and a processor receiving and responsive to the detectorsignal from the transmission line probe for determining at least onecharacteristic representative of the DUT as a function of the sampledmagnitude of the standing wave on the transmission line, said processorbeing further configured for generating the phase shifter controlsignal.
 18. A vector network analyzer of claim 17, wherein thetransmission line comprises one or more of the following: a waveguide, acoaxial line, and a micro-strip line.
 19. A vector network analyzer ofclaim 17, wherein the transmission line probe comprises at least oneactive element for producing a signal proportional to the magnitude ofthe standing wave.
 20. A vector network analyzer of claim 19, whereinthe active element of the transmission line probe comprises a diode. 21.A vector network analyzer of claim 17, further comprising a signalsource for providing a signal incident to the DUT, wherein the signalincident to the DUT and a signal reflected from the DUT form thestanding wave on the transmission line, and wherein said signal sourceis responsive to a source control signal for altering its output.
 22. Avector network analyzer of claim 21, wherein the standing wave on thetransmission line comprises the signal incident to the DUT, the signalreflected from the DUT, and a signal transmitted through the DUTopposite in direction to the signal incident to the DUT.
 23. A vectornetwork analyzer of claim 22, further comprising a directionallyisolating element for enabling the signal transmitted through the DUTopposite in direction to the signal incident to the DUT to pass throughthe DUT.
 24. A vector network analyzer of claim 23, wherein thedirectionally isolating element comprises a switch and a signalisolator.
 25. A phase shifter coupled with a transmission line forapplying a phase shift to a signal on the transmission line, said signalbeing at a frequency greater than very high frequency, said phaseshifter comprising a waveguide having a plurality of slots formedtherein, said slots each having dimensions that are sub-resonant withrespect to a wavelength of the signal on the transmission line, and saidslots each having an active element corresponding thereto for loadingthe slots to control the phase shift applied to the signal.